{"product_id":"9781493966745-scanning-electron-microscopy-and-x-ray-microanalysis","title":"Joy David C. - Scanning Electron Microscopy And X - Ray Microanalysis - Hardcover","description":"Binding: Hardcover\u003cbr\u003e\nDescription: This thoroughly revised and updated Fourth Edition of a time - honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM) energy dispersive X - ray spectrometry (EDS) for elemental microanalysis electron backscatter diffraction analysis (EBSD) for micro - crystallography and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource while SEM operators and a diversity of practitioners engineers technicians physical and biological scientists clinicians and technical managers will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past this Fourth Edition de - emphasizes the design and physical operating basis of the instrumentation including the electron sources lenses detectors etc. In the modern SEM many of the low level instrument parameters are now controlled and optimized by the microscope's software and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy microanalysis and micro - crystallography. Therefore special emphasis is placed on beam energy beam current electron detector characteristics and controls and ancillary techniques such as energy dispersive x - ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology elemental composition and crystal structure can be evaluated simultaneously. Extension of the SEM into a \"dual beam\" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities variable pressure SEM operation theory and measurement of x - rays with high throughput silicon drift detector (SDD - EDS) x - ray spectrometers. In addition to powerful vendor - supplied software to support data collection and processing the microscopist can access advanced capabilities available in free open source software platforms including the National Institutes of Health (NIH) Image J - Fiji for image processing and the National Institute of Standards and Technology (NIST) DTS a II for quantitative EDS x - ray microanalysis and spectral simulation both of which are extensively used in this work. However the user has a responsibility to bring intellect curiosity and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical hands - on operation of the microscope particularly user selection of the critical operating parameters to achieve meaningful results Provides step - by - step overviews of SEM EDS and EBSD and checklists of critical issues for SEM imaging EDS x - ray microanalysis and EBSD crystallographic measurements Makes extensive use of open source software: NIH Image J - FIJI for image processing and NIST DTS a II for quantitative EDS x - ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relatively self - contained modules no need to \"read it all\" to understand a topic\u003cbr\u003e\nTitle: Scanning Electron Microscopy And X - Ray Microanalysis\u003cbr\u003e\nAuthor(s): Joy David C.\u003cbr\u003e\nPublisher: Springer - Verlag New York Inc.\u003cbr\u003e\nBarcode: 9781493966745\u003cbr\u003e\nPages: 550 Pages, 409 Illustrations, Color; 137 Illustrations, Black And White; Xxiii, 550 P. 546 Illus., 4\u003cbr\u003e\nPublication Date: 11\/18\/2017\u003cbr\u003e\nCategory: Testing Of Materials","brand":"Joy David C.","offers":[{"title":"Default Title","offer_id":51623777435953,"sku":"IN-G-9781493966745","price":123.87,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0644\/6759\/9594\/files\/9781493966745.jpg?v=1752296525","url":"https:\/\/bookdelivered.com\/products\/9781493966745-scanning-electron-microscopy-and-x-ray-microanalysis","provider":"Book Delivered","version":"1.0","type":"link"}